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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
Off-axis electron holography without Fresnel fringes
Kazuo Yamamoto1, Tsukasa Hirayama, Takayoshi Tanji
1Japan Society for the Promotion of Science, c/o Japan Fine Ceramics Center, 2-4-1, Mutsuno, Atsuta, Nagoya 456-8587, Japan. k_yamamoto@jfcc.or.jp
Abstract:
A new method for forming an electron hologram without Fresnel fringes caused by an electron biprism is presented. Adding a fine filament to the ordinary setup for off-axis electron holography directly prevented Fresnel diffraction at the electron biprism and eliminated 70% of the phase error due to the Fresnel diffraction. This made it possible to obtain a hologram having uniform interference fringes, and to reconstruct a clear phase image of a weak electric-field.
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