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Ultramicroscopy|January 19, 2025
Semicircular-aperture illumination scanning transmission electron microscopyAkira Yasuhara, Fumio Hosokawa, Sadayuki Asaoka, et al.
Ultramicroscopy|March 26, 2025
Quantitative evaluation of local magnetic property using magnetic domain wall width measurement with tilt-scan averaged DPC STEMYoshiki O Murakami, Takehito Seki, Koudai Tabata, et al.
Ultramicroscopy|March 12, 2025
Acquisition of object and temperature series in medium resolution off-axis electron holography with live drift correctionThibaud Denneulin, Benjamin Zingsem, Joseph Vas, et al.
Ultramicroscopy|March 8, 2025
Negative stain TEM imaging of native spider silk protein superstructuresHannah R Johnson, Legend Foster, Anikin Rae Domingo, et al.
Ultramicroscopy|March 13, 2025
Bi-directional LEEM and eV-TEM spectroscopy on a graphene-hBN heterostackPeter S Neu, Eugene E Krasovskii, Rudolf M Tromp, et al.
Ultramicroscopy|November 9, 2024
New experimental methodology for determining the second crossover energy in insulators under stationary e-irradiation in a SEMH Hammami, S Fakhfakh
Ultramicroscopy|October 8, 2024
Development of a liquid-helium free cryogenic sample holder with mK temperature control for autonomous electron microscopyX He, R Kostin, E Knight, et al.
Ultramicroscopy|September 25, 2024
EBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometriesGrzegorz Cios, Aimo Winkelmann, Gert Nolze, et al.
Ultramicroscopy|September 22, 2024
Effective removal of global tilt from atomically-resolved topography images of vicinal surfaces with narrow terracesA Yu Aladyshkin, A N Chaika, V N Semenov, et al.
Ultramicroscopy|September 19, 2024
Theoretical study on the effect of temperature gradient on contact-free scanning for scanning ion conductance microscopyZhiwu Wang, Jian Zhuang, Lidong Zhou, et al.
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