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Ultramicroscopy|December 7, 2007
An electron microscope for the aberration-corrected eraO L Krivanek, G J Corbin, N Dellby, et al.Ultramicroscopy|February 12, 2008
Position-sensitive diffractive imaging in STEM by an automated chaining diffraction algorithmV V Volkov, J Wall, Y ZhuUltramicroscopy|April 9, 2008
Symmetry in electron diffractions from helical structuresJiong Zhang, Jing ZhuUltramicroscopy|April 9, 2008
AFM picking-up manipulation of the metaphase chromosome fragment by using the tweezers-type probeKeiichiro Yamanaka, Masato Saito, Motoharu Shichiri, et al.Ultramicroscopy|June 3, 2008
A simple method for AFM tip characterization by polystyrene spheresZhi-Gang Zeng, Guo-dong Zhu, Zhang Guo, et al.Ultramicroscopy|January 17, 2025
An applied noise model for low-loss EELS mapsChristian Zietlow, Jörg K N LindnerUltramicroscopy|January 19, 2025
Semicircular-aperture illumination scanning transmission electron microscopyAkira Yasuhara, Fumio Hosokawa, Sadayuki Asaoka, et al.Ultramicroscopy|March 26, 2025
Quantitative evaluation of local magnetic property using magnetic domain wall width measurement with tilt-scan averaged DPC STEMYoshiki O Murakami, Takehito Seki, Koudai Tabata, et al.Ultramicroscopy|March 12, 2025
Acquisition of object and temperature series in medium resolution off-axis electron holography with live drift correctionThibaud Denneulin, Benjamin Zingsem, Joseph Vas, et al.Pageof 460