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Ultramicroscopy|March 15, 2006
Projected potential profiles across interfaces obtained by reconstructing the exit face wave function from through focal seriesSomnath Bhattacharyya, Christoph T Koch, Manfred RühleUltramicroscopy|March 7, 2006
Environmental electron microscopy (ETEM) for catalysts with a closed E-cell with carbon windowsS Giorgio, S Sao Joao, S Nitsche, et al.Ultramicroscopy|January 30, 2007
Precession technique and electron diffractometry as new tools for crystal structure analysis and chemical bonding determinationA Avilov, K Kuligin, S Nicolopoulos, et al.Ultramicroscopy|December 7, 2007
Magnetic circular dichroism in electron energy loss spectrometryC Hébert, P Schattschneider, S Rubino, et al.Ultramicroscopy|December 7, 2007
STEM nanodiffraction technique for structural analysis of CoPt nanoparticlesD Alloyeau, C Ricolleau, T Oikawa, et al.Ultramicroscopy|December 7, 2007
In situ measurements and transmission electron microscopy of carbon nanotube field-effect transistorsTaekyung Kim, Seongwon Kim, Eric Olson, et al.Ultramicroscopy|October 1, 1991
A protocol for 3D image reconstruction from a single image of an oblique sectionK A Taylor, R A CrowtherUltramicroscopy|December 7, 2007
High-resolution scanning near-field EBIC microscopy: application to the characterisation of a shallow ion implanted p+-n silicon junctionK Smaali, J Fauré, A El Hdiy, et al.Ultramicroscopy|January 21, 2006
Quantitative Fresnel Lorentz microscopy and the transport of intensity equationS McVitie, M CushleyUltramicroscopy|February 21, 2006
Lensless electron reflection microscopy using a coaxial point-source structureZoubida Hammadi, Roger MorinPageof 460