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Ultramicroscopy|October 28, 2024
Development of ultrafast four-dimensional precession electron diffractionToshiya Shiratori, Jumpei Koga, Takahiro Shimojima, et al.Ultramicroscopy|October 26, 2024
Parameter dependence of depth and lateral resolution of transmission Kikuchi diffractionGlenn C Sneddon, Patrick W Trimby, Levi Tegg, et al.Ultramicroscopy|February 27, 2025
A versatile machine learning workflow for high-throughput analysis of supported metal catalyst particlesArda Genc, Justin Marlowe, Anika Jalil, et al.Ultramicroscopy|August 3, 2024
Characterization of structure and mixing in nanoparticle hetero-aggregates using convolutional neural networks: 3D-reconstruction versus 2D-projectionChristoph Mahr, Jakob Stahl, Beeke Gerken, et al.Ultramicroscopy|August 30, 2024
Differential phase contrast from electrons that cause inner shell ionizationMichael Deimetry, Timothy C Petersen, Hamish G Brown, et al.Ultramicroscopy|August 18, 2024
The effect of the acceleration voltage on the quality of structure determination by 3D-electron diffractionSaleh Gholam, Joke HadermannUltramicroscopy|May 3, 2006
Effective mass and flow patterns of fluids surrounding microcantileversDon W Dareing, Fang Tian, Thomas ThundatUltramicroscopy|March 28, 2006
Analytical solutions of the first three frequency shifts of AFM non-uniform probe subjected to the Lennard-Jones forceShueei-Muh Lin, Chihng-Tsung Liauh, Wen-Rong Wang, et al.Ultramicroscopy|June 20, 2006
Atomic force microscope tip spontaneous retraction from dielectric surfaces under applied electrostatic potentialS F Lyuksyutov, P B Paramonov, O V Mayevska, et al.Ultramicroscopy|June 10, 2006
Study on nanoscale abrasive interaction between nanoprobe and self-assembled molecular surface for probe-based nanolithography processIn-Ha Sung, Dae-Eun KimPageof 458