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EBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometries.

Grzegorz Cios1, Aimo Winkelmann1, Gert Nolze2

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|September 25, 2024
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Summary
This summary is machine-generated.

Electron backscatter diffraction (EBSD) and transmission Kikuchi diffraction (TKD) patterns with inverted contrast can be accurately indexed. Physics-based simulated master patterns overcome challenges in nanoscale topography and low-tilt geometries.

Keywords:
Contrast inversionEBSDKikuchi diffractionTKDTopography

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Area of Science:

  • Materials Science
  • Crystallography
  • Electron Microscopy

Background:

  • Electron backscatter diffraction (EBSD) and transmission Kikuchi diffraction (TKD) patterns can exhibit inverted Kikuchi band contrast.
  • This phenomenon occurs due to anomalous absorption, particularly in samples with nanoscale topography, low-tilt geometries, or thicker specimens in TKD.

Purpose of the Study:

  • To demonstrate the application of physics-based simulated master patterns with inverted contrast for accurate crystal orientation determination.
  • To address challenges in indexing EBSD and TKD patterns where standard methods fail due to contrast inversion.

Main Methods:

  • Utilized physics-based simulated master patterns with inverted contrast for indexing.
  • Applied brute force indexing for complex cases.
  • Investigated EBSD on gold nanostructures and non-tilted surfaces.
  • Examined TKD on duplex stainless steel foils.
  • Mathematically inverted inverted-contrast patterns to normal contrast.

Main Results:

  • Successfully indexed previously uninterpretable EBSD patterns from gold nanostructures using contrast-inverted master patterns.
  • Indexed EBSD maps from a non-tilted surface by applying contrast-inverted patterns.
  • Indexed significant areas of thicker TKD samples exhibiting contrast inversion, expanding evaluable data.
  • Achieved successful Hough/Radon-based indexing after mathematically inverting contrast-inverted patterns.

Conclusions:

  • Physics-based simulated master patterns with inverted contrast are effective for solving crystal orientation problems.
  • This approach significantly enhances the success rate and area coverage in EBSD and TKD analyses, especially for challenging sample geometries and conditions.