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Ultramicroscopy|January 10, 2013
Quantitative analysis of interfacial strain in InAs/GaSb superlattices by aberration-corrected HRTEM and HAADF-STEMKrishnamurthy Mahalingam, Heather J Haugan, Gail J Brown, et al.
Ultramicroscopy|January 1, 2013
Beam spot diameter of the near-field scanning electron microscopyA Kyritsakis, J P Xanthakis
Ultramicroscopy|January 1, 2013
Statistical consequences of applying a PCA noise filter on EELS spectrum imagesStijn Lichtert, Jo Verbeeck
Ultramicroscopy|April 24, 2013
Blind deconvolution of time-of-flight mass spectra from atom probe tomographyL J S Johnson, M Thuvander, K Stiller, et al.
Ultramicroscopy|May 29, 2013
Picosecond electron bunches from GaAs/GaAsP strained superlattice photocathodeXiuguang Jin, Shunya Matsuba, Yosuke Honda, et al.
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