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Ultramicroscopy|January 11, 2005
Modeling and calculation of field emission enhancement factor for carbon nanotubes arrayX Q Wang, M Wang, Z H Li, et al.
Ultramicroscopy|January 11, 2005
EDM 1.0: electron direct methodsR Kilaas, L D Marks, C S Own
Ultramicroscopy|September 29, 2004
Normalizing projection images: a study of image normalizing procedures for single particle three-dimensional electron microscopyC O S Sorzano, L G de la Fraga, R Clackdoyle, et al.
Ultramicroscopy|September 29, 2004
Surface charge compensation for a highly charged ion emission microscopeJ W McDonald, A V Hamza, M W Newman, et al.
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