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Ultramicroscopy|June 18, 2013
Imaging of Au nanoparticles deeply buried in polymer matrix by various atomic force microscopy techniquesKuniko Kimura, Kei Kobayashi, Kazumi Matsushige, et al.Ultramicroscopy|June 18, 2013
An alternative approach to determine attainable resolution directly from HREM imagesA Wang, S Turner, S Van Aert, et al.Ultramicroscopy|June 19, 2013
Apparent increase in the thickness of superconducting particles at low temperatures measured by electron holographyJ E HirschUltramicroscopy|February 5, 2013
Observation of synchronized atomic motions in the field ion microscopeFhm F Rahman, John A Notte, Richard H Livengood, et al.Ultramicroscopy|February 5, 2013
First experimental proof for aberration correction in XPEEM: resolution, transmission enhancement, and limitation by space charge effectsTh Schmidt, A Sala, H Marchetto, et al.Ultramicroscopy|July 23, 2013
The influence of inelastic scattering on EFTEM images--exemplified at 20 kV for graphene and siliconZ Lee, H Rose, R Hambach, et al.Ultramicroscopy|July 23, 2013
Optical image contrast enhancement in near-field optics induced by water condensationMaysoun Douas, Manuel I Marqués, Pedro A SerenaUltramicroscopy|March 27, 2013
Micromagnetism in (001) magnetite by spin-polarized low-energy electron microscopyJuan de la Figuera, Lucía Vergara, Alpha T N'diaye, et al.Ultramicroscopy|July 31, 2013
TEM study of 〈110〉-type 35.26° dislocations specially induced by polishing of SrTiO₃ single crystalsL Jin, X Guo, C L JiaUltramicroscopy|September 7, 2013
Weighted simultaneous iterative reconstruction technique for single-axis tomographyD Wolf, A Lubk, H LichtePageof 460