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Ultramicroscopy|December 10, 2013
Atomic structure from large-area, low-dose exposures of materials: a new route to circumvent radiation damageJ C Meyer, J Kotakoski, C ManglerUltramicroscopy|November 27, 2013
Correlated cryo-fluorescence and cryo-electron microscopy with high spatial precision and improved sensitivityMartin Schorb, John A G BriggsUltramicroscopy|December 17, 2013
Coordinate transformation based cryo-correlative methods for electron tomography and focused ion beam millingYoshiyuki Fukuda, Nikolas Schrod, Miroslava Schaffer, et al.Ultramicroscopy|November 26, 2013
Channelling contrast analysis of lattice images: conditions for probe-insensitive STEMChris J Rossouw, Christian Dwyer, Hadas Katz-Boon, et al.Ultramicroscopy|September 24, 2013
Thickness measurement of soft thin films on periodically patterned magnetic substrates by phase difference magnetic force microscopyD Passeri, C Dong, L Angeloni, et al.Ultramicroscopy|October 17, 2013
Vortex beam production and contrast enhancement from a magnetic spiral phase plateA M Blackburn, J C LoudonUltramicroscopy|January 1, 1985
Considerations for the quantitative analysis of coated reliefsJ P ChalcroftUltramicroscopy|January 1, 1985
Comparative electron microscopic studies of single biomolecules negatively stained and freeze-dried metal-shadowedB Tesche, H SchmiadyUltramicroscopy|May 29, 2012
On the alignment for precession electron diffractionYifeng Liao, Laurence D MarksUltramicroscopy|May 29, 2012
Determination of the chemical composition of GaNAs using STEM HAADF imaging and STEM strain state analysisTim Grieb, Knut Müller, Rafael Fritz, et al.Pageof 460