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Ultramicroscopy|August 30, 2016
Accurate measurement of absolute experimental inelastic mean free paths and EELS differential cross-sectionsAlan J Craven, Joanna Bobynko, Bianca Sala, et al.
Ultramicroscopy|August 24, 2016
Surface topography analysis with application of roughness area dependence methodAdam Szyszka, Mateusz Wośko, Tomasz Szymański, et al.
Ultramicroscopy|March 2, 2010
Object wave reconstruction by phase-plate transmission electron microscopyB Gamm, M Dries, K Schultheiss, et al.
Ultramicroscopy|March 9, 2010
Verification of surfactant CHAPS effect using AFM for making biomemory device consisting of recombinant azurin monolayerTaek Lee, Waleed Ahmed El-Said, Junhong Min, et al.
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