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Ultramicroscopy|August 2, 2017
Feedforward neural network methodology to characterize thin films by Electrostatic Force MicroscopyM Konomi, G M SachaUltramicroscopy|August 7, 2017
Imaging the potential distribution of individual charged impurities on graphene by low-energy electron holographyTatiana Latychevskaia, Flavio Wicki, Conrad Escher, et al.Ultramicroscopy|June 6, 2016
Denoising time-resolved microscopy image sequences with singular value thresholdingTom Furnival, Rowan K Leary, Paul A MidgleyUltramicroscopy|December 3, 2015
Spherical aberration correction with threefold symmetric line currentsShahedul Hoque, Hiroyuki Ito, Ryuji Nishi, et al.Ultramicroscopy|December 2, 2015
Orientation mapping by transmission-SEM with an on-axis detectorJ J Fundenberger, E Bouzy, D Goran, et al.Ultramicroscopy|December 15, 2015
Cross-sectional atom probe tomography sample preparation for improved analysis of fins on SOIAndrew J Martin, Weihao Weng, Zhengmao Zhu, et al.Ultramicroscopy|November 15, 2017
Variation of field enhancement factor near the emitter tipDebabrata Biswas, Gaurav Singh, Shreya G Sarkar, et al.Ultramicroscopy|December 2, 2017
Electron-beam broadening in amorphous carbon films in low-energy scanning transmission electron microscopyH Drees, E Müller, M Dries, et al.Ultramicroscopy|December 15, 2017
Wet-chemical etching of atom probe tips for artefact free analyses of nanoscaled semiconductor structuresD Melkonyan, C Fleischmann, A Veloso, et al.Pageof 458