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Ultramicroscopy|May 20, 2008
A formula for the image intensity of phase objects in Zernike modeMarco BeleggiaUltramicroscopy|April 15, 2008
Novel carbon nanosheets as support for ultrahigh-resolution structural analysis of nanoparticlesChristoph T Nottbohm, Andre Beyer, Alla S Sologubenko, et al.Ultramicroscopy|April 8, 2025
Splicing dual-range EELS spectra: Identifying and correcting artefactsAlan J Craven, Bianca Sala, Donald A MacLaren, et al.Ultramicroscopy|April 25, 2025
Influence of experimental conditions on apparent AFM tip-surface contact in airIlya A Morozov, Roman I IzyumovUltramicroscopy|June 4, 2025
Multimode objective lens for momentum microscopy and XPEEM: TheoryOlena Tkach, Gerd SchönhenseUltramicroscopy|May 17, 2025
Quantitative magnetic mapping in TEM through accurate 2D thickness determinationJoseph Vimal Vas, Hasan Ali, Wen Shi, et al.Ultramicroscopy|May 12, 2025
Compact design, construction, and evaluation of an in situ ±90° rotatable magnetic force microscope in a 12 T superconducting magnetMin Zhang, Shuai Dong, Zihao Li, et al.Ultramicroscopy|January 31, 2026
Exploring the potential of simultaneous resonance in multi-frequency atomic force microscopyMostafa Ghanbari Kouchaksaraei, Arash BahramiUltramicroscopy|February 11, 2026
Anisotropic redistribution of coherently de-channelled electrons around dislocations in gallium nitride revealed by 4D Scanning Transmission Electron MicroscopyCorrado Bongiorno, Antonio M Mio, Gianfranco Sfuncia, et al.Pageof 460