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Related Experiment Videos

Nonstandard imaging methods in electron microscopy

H Rose

    Ultramicroscopy
    |April 1, 1977
    PubMed
    Summary
    This summary is machine-generated.

    Image formation in electron microscopy is clarified, revealing how inelastic scattering impacts elastic scattering. Double scattering explains observed diffractogram wings, and hollow-cone illumination reduces noise in phase contrast imaging.

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    Area of Science:

    • Electron microscopy
    • Image formation theory
    • Scattering phenomena

    Background:

    • Conventional Transmission Electron Microscopy (CTEM) and Scanning Transmission Electron Microscopy (STEM) image formation models often simplify scattering processes.
    • Understanding the influence of inelastic scattering and illumination coherence is crucial for accurate image interpretation.
    • Existing models may not fully explain complex phenomena like diffractogram wings observed in amorphous materials.

    Purpose of the Study:

    • To provide a rigorous treatment of image formation in CTEM, incorporating inelastic scattering and partial coherence.
    • To extend these findings to STEM imaging.
    • To investigate novel illumination techniques for noise reduction and contrast enhancement.

    Main Methods:

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  • Development of a generalized optical theorem connecting elastic and inelastic scattering amplitudes.
  • Analysis of electron scattering under tilted beam and hollow-cone illumination.
  • Calculation of phase contrast transfer functions (PCTFs) for various illumination modes and corrected microscopes.
  • Investigation of contrast transfer in STEM with split detectors.

    • Main Results:

    • A generalized optical theorem demonstrates that inelastic scattering influences the elastic scattering amplitude.
    • Observed diffractogram wings in amorphous materials are explained by assuming double scattering (elastic and inelastic).
    • Hollow-cone illumination effectively suppresses structural noise in phase contrast images.
    • PCTFs were calculated for different hollow-cone angles and for corrected microscopes with positive and negative phase contrast.
    • Contrast transfer was analyzed for a STEM system with a split detector.

    Conclusions:

    • The study provides a more complete theoretical framework for electron image formation, accounting for inelastic scattering effects.
    • Double scattering is identified as a key factor in explaining specific image artifacts.
    • Hollow-cone illumination offers a promising strategy for improving image quality by reducing noise.
    • The theoretical results have implications for optimizing imaging parameters and interpreting micrographs in both CTEM and STEM.