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Ultramicroscopy|May 30, 2006
Components for high speed atomic force microscopyGeorg E Fantner, Georg Schitter, Johannes H Kindt, et al.Ultramicroscopy|May 30, 2006
Scanning transmission ion micro-tomography (STIM-T) of biological specimensMicheal Schwertner, Arthur Sakellariou, Tilo Reinert, et al.Ultramicroscopy|June 1, 2006
Near-field reflection backscattering apertureless optical microscopy: application to spectroscopy experiments on opaque samples, comparison between lock-in and digital photon counting detection techniquesS Diziain, J-L Bijeon, P-M Adam, et al.Ultramicroscopy|June 12, 2010
A new method for the reconstruction of micro- and nanoscale planar periodic structuresZhenxing Hu, Huimin Xie, Jian Lu, et al.Ultramicroscopy|October 1, 2010
Construction of an organic crystal structural model based on combined electron and powder X-ray diffraction data and the charge flipping algorithmJinsong Wu, Yong Sheng Zhao, Hefei Hu, et al.Ultramicroscopy|October 5, 2010
Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patternsT B Britton, C Maurice, R Fortunier, et al.Ultramicroscopy|July 27, 2010
Linear versus non-linear structural information limit in high-resolution transmission electron microscopyS Van Aert, J H Chen, D Van DyckUltramicroscopy|July 24, 2010
Multivariate statistical analysis of atom probe tomography dataChad M Parish, Michael K MillerUltramicroscopy|August 11, 2010
A combined environmental straining specimen holder for high-voltage electron microscopyYoshimasa Takahashi, Masaki Tanaka, Kenji Higashida, et al.Ultramicroscopy|August 10, 2010
Reciprocal and real space maps for EMCD experimentsHans Lidbaum, Ján Rusz, Stefano Rubino, et al.Pageof 458