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Ultramicroscopy|June 20, 2008
Single molecular conductance measurements of molecular junction of Au/1,4-phenylenediamine/AuJ Tobita, Y Kato, M FujihiraUltramicroscopy|June 20, 2008
Electrostatic force microscopy measurements of charge trapping behavior of Au nanoparticles embedded in metal-insulator-semiconductor structureJungYup Yang, JooHyung Kim, JunSeok Lee, et al.Ultramicroscopy|June 9, 2006
Spatial incoherence in phase retrieval based on focus variationA V Martin, F-R Chen, W-K Hsieh, et al.Ultramicroscopy|June 2, 2006
An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic imagesM D Croitoru, D Van Dyck, S Van Aert, et al.Ultramicroscopy|June 6, 2006
Microfabricated torsion levers optimized for low force and high-frequency operation in fluidsArthur Beyder, Frederick SachsUltramicroscopy|April 17, 2007
Exploring the next neighbourhood relationship in amorphous alloys utilizing atom probe tomographyAhmed Shariq, Talaat Al-Kassab, Reiner Kirchheim, et al.Ultramicroscopy|April 17, 2007
General three-dimensional image simulation and surface reconstruction in scanning probe microscopy using a dexel representationXiaoping Qian, J S VillarrubiaUltramicroscopy|January 20, 2007
Structure determination of the hexagonal quasicrystal approximant micro'-(Al,Si)4Cr by the strong reflections approachZ B He, X D Zou, S Hovmöller, et al.Ultramicroscopy|October 25, 2008
A simple and accurate method for calibrating the oscillation amplitude of tuning-fork based AFM sensorsJinquan Liu, Andrea Callegari, Martin Stark, et al.Ultramicroscopy|September 7, 2007
Vector field electron tomography of magnetic materials: theoretical developmentC Phatak, M Beleggia, M De GraefPageof 460