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Ultramicroscopy|October 28, 2008
A second-order focusing electrostatic toroidal electron spectrometer with 2pi radian collectionAnjam Khursheed, Hung Quang HoangUltramicroscopy|June 1, 1991
Temperature directly affects the rate of irradiation-induced mass loss from phosphatidylcholine multilayersM K Lamvik, A D Magid, S D Davilla, et al.Ultramicroscopy|June 19, 2007
Chemical patterns of octadecyltrimethoxysilane monolayers for the selective deposition of nanoparticles on silicon substrateL Ressier, B Viallet, J Grisolia, et al.Ultramicroscopy|June 19, 2007
Vibration response of microcantilevers bounded by a confined fluidDon W Dareing, Dechang Yi, Thomas ThundatUltramicroscopy|June 20, 2007
An experimental investigation of analog delay generation for dynamic control of microsensors and atomic force microscopyD Yi, A Passian, A L Lereu, et al.Ultramicroscopy|June 20, 2007
New method for electrostatic force gradient microscopy observations and Kelvin measurements under vacuumL Portes, M Ramonda, R Arinero, et al.Ultramicroscopy|March 14, 2007
Detection of Cd(II) using antibody-modified microcantilever sensorsSreepriya Velanki, Shantell Kelly, Thomas Thundat, et al.Ultramicroscopy|June 15, 2007
Adhesive interaction measured between AFM probe and lung epithelial type II cellsZoya Leonenko, Eric Finot, Matthias AmreinUltramicroscopy|June 15, 2007
Measuring the sizes of nanospheres on a rough surface by using atomic force microscopy and a curvature-reconstruction methodKoudai Oikawa, Hyonchol Kim, Naoya Watanabe, et al.Ultramicroscopy|September 4, 2007
Influence of the overlap parameter on the convergence of the ptychographical iterative engineOliver Bunk, Martin Dierolf, Søren Kynde, et al.Pageof 460