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Ultramicroscopy|April 18, 2006
CTF determination and correction in electron cryotomographyJ J Fernández, S Li, R A Crowther
Ultramicroscopy|April 30, 2010
Cryo-staining techniques in cryo-TEM studies of dispersed nanotubesEran Edri, Oren Regev
Ultramicroscopy|May 14, 2010
Fabrication and characterization of low aberration micrometer-sized electron lensesE Steinwand, J-N Longchamp, H-W Fink
Ultramicroscopy|May 18, 2010
Bridging the gap between conventional and video-speed scanning probe microscopesA J Fleming, B J Kenton, K K Leang
Ultramicroscopy|April 24, 2010
Tunneling/shear force microscopy using piezoelectric tuning forks for characterization of topography and local electric surface propertiesMirosław Woszczyna, Paweł Zawierucha, Agata Masalska, et al.
Ultramicroscopy|May 4, 2010
5.4 nm spatial resolution in biological photoemission electron microscopyR Könenkamp, Robert C Word, G F Rempfer, et al.
Ultramicroscopy|April 17, 2010
A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and designR M Tromp, J B Hannon, A W Ellis, et al.
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