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Ultramicroscopy|July 9, 2013
Method for local temperature measurement in a nanoreactor for in situ high-resolution electron microscopyS B Vendelbo, P J Kooyman, J F Creemer, et al.Ultramicroscopy|July 10, 2013
Compressed sensing electron tomographyRowan Leary, Zineb Saghi, Paul A Midgley, et al.Ultramicroscopy|July 5, 2013
Comparison of intensity and absolute contrast of simulated and experimental high-resolution transmission electron microscopy images for different multislice simulation methodsFlorian F Krause, Knut Müller, Dennis Zillmann, et al.Ultramicroscopy|July 5, 2013
On the interaction of an ultra-fast laser with a nanometric tip by laser assisted atom probe tomography: a reviewA VellaUltramicroscopy|July 24, 2013
Minimum detection limit and spatial resolution of thin-sample field-emission electron probe microanalysisYugo Kubo, Kotaro Hamada, Akira UranoUltramicroscopy|March 19, 2013
Determining polarity and dislocation core structures at atomic level for epitaxial AlN/(0001)6H-SiC from a single image in HRTEMY X Cui, Y M Wang, C Wen, et al.Ultramicroscopy|March 20, 2013
Low-energy electron reflectivity from graphene: first-principles computations and approximate modelsR M Feenstra, M WidomUltramicroscopy|June 12, 2013
Estimations of bulk geometrically necessary dislocation density using high resolution EBSDT J Ruggles, D T FullwoodUltramicroscopy|April 3, 2013
Spatial high resolution energy dispersive X-ray spectroscopy on thin lamellasChristian Notthoff, Markus Winterer, Andreas Beckel, et al.Ultramicroscopy|May 1, 2013
Spin polarized low energy electron microscopy of quantum well resonances in Fe films on the Cu-covered W(110) surfaceQiang Wu, M S AltmanPageof 458