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Ultramicroscopy|November 18, 2011
Combining scanning tunneling microscopy and synchrotron radiation for high-resolution imaging and spectroscopy with chemical, electronic, and magnetic contrastM L Cummings, T Y Chien, C Preissner, et al.
Ultramicroscopy|August 26, 2011
Influence of the tip mass on the tip-sample interactions in TM-AFMHossein Nejat Pishkenari, Ali Meghdari
Ultramicroscopy|September 28, 2011
Coherent Bremsstrahlung effect observed during STEM analysis of dopant distribution in silicon devices using large area silicon drift EDX detectors and high brightness electron sourceR Pantel
Ultramicroscopy|June 26, 2012
Seeing the atoms more clearly: STEM imaging from the Crewe era to todayS J Pennycook
Ultramicroscopy|April 24, 2013
Reconstructing atom probe data: a reviewFrancois Vurpillot, Baptiste Gault, Brian P Geiser, et al.
Ultramicroscopy|July 9, 2013
Electron holography for fields in solids: problems and progressHannes Lichte, Felix Börrnert, Andreas Lenk, et al.
Ultramicroscopy|July 10, 2013
Quantitative evaluation of temporal partial coherence using 3D Fourier transforms of through-focus TEM imagesKoji Kimoto, Hidetaka Sawada, Takeo Sasaki, et al.
Ultramicroscopy|July 24, 2013
The interaction of a nanoscale coherent helium-ion probe with a crystalA J D'Alfonso, B D Forbes, L J Allen
Ultramicroscopy|June 12, 2013
Recording low and high spatial frequencies in exit wave reconstructionsS J Haigh, B Jiang, D Alloyeau, et al.
Ultramicroscopy|November 13, 2012
Interpretation of atom probe tomography data for the intermetallic TiAl+Nb by means of field evaporation simulationT Boll, T Al-Kassab
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