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Ultramicroscopy|August 15, 2017
200 keV cold field emission source using carbon cone nanotip: Application to scanning transmission electron microscopyShuichi Mamishin, Yudai Kubo, Robin Cours, et al.Ultramicroscopy|July 21, 2017
Atomic force microscopy study of morphological modifications induced by different decontamination treatments on Escherichia coliFlorina Lucica Zorila, Cristina Ionescu, Liviu Stefan Craciun, et al.Ultramicroscopy|August 7, 2017
Probing the effect of electron channelling on atomic resolution energy dispersive X-ray quantificationKatherine E MacArthur, Hamish G Brown, Scott D Findlay, et al.Ultramicroscopy|July 18, 2017
Spatial resolution and cathodoluminescence intensity dependence on acceleration voltage in electron beam excitation assisted optical microscopy using Y2O3:Eu3+ filmYu Masuda, Masashi Kamiya, Atsushi Sugita, et al.Ultramicroscopy|October 24, 2017
Analytical transmission cross-coefficients for pink beam X-ray microscopy based on compound refractive lensesKen Vidar Falch, Carsten Detlefs, Anatoly Snigirev, et al.Ultramicroscopy|October 27, 2017
Relative merits and limiting factors for x-ray and electron microscopy of thick, hydrated organic materialsMing Du, Chris JacobsenUltramicroscopy|August 25, 2017
Gas effect on the emission and detection of the backscattered electrons in a VP-SEM at low energyZ Hafsi, O Mansour, A Kadoun, et al.Ultramicroscopy|August 27, 2017
Automated approaches for band gap mapping in STEM-EELSCecilie S Granerød, Wei Zhan, Øystein PrytzUltramicroscopy|September 9, 2017
Numerical modeling of specimen geometry for quantitative energy dispersive X-ray spectroscopyW Xu, J H Dycus, J M LeBeauUltramicroscopy|September 10, 2017
Stereo-vision three-dimensional reconstruction of curvilinear structures imaged with a TEMEmad Oveisi, Antoine Letouzey, Sandro De Zanet, et al.Pageof 460