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Ultramicroscopy|September 10, 2014
Characterization of an indirect X-ray imaging detector by simulation and experimentC Doshi, G van Riessen, E Balaur, et al.Ultramicroscopy|August 16, 2014
A correlative approach to segmenting phases and ferrite morphologies in transformation-induced plasticity steel using electron back-scattering diffraction and energy dispersive X-ray spectroscopyAzdiar A Gazder, Fayez Al-Harbi, Hendrik Th Spanke, et al.Ultramicroscopy|June 24, 2016
Monte Carlo modeling of ion beam induced secondary electronsU Huh, W Cho, D C JoyUltramicroscopy|July 5, 2016
On detector linearity and precision of beam shift detection for quantitative differential phase contrast applicationsJosef Zweck, Felix Schwarzhuber, Johannes Wild, et al.Ultramicroscopy|December 2, 2015
Characterizing the response of a scintillator-based detector to single electronsXiahan Sang, James M LeBeauUltramicroscopy|December 2, 2015
Direct in situ thermometry: Variations in reciprocal-lattice vectors and challenges with the Debye-Waller effectDaniel R Cremons, David J FlanniganUltramicroscopy|December 2, 2015
Realization of a tilted reference wave for electron holography by means of a condenser biprismFalk Röder, Florent Houdellier, Thibaud Denneulin, et al.Ultramicroscopy|December 2, 2015
Dopant profiling based on scanning electron and helium ion microscopyAugustus K W Chee, Stuart A BodenUltramicroscopy|December 3, 2015
Performance of a direct detection camera for off-axis electron holographyShery L Y Chang, Christian Dwyer, Juri Barthel, et al.Ultramicroscopy|December 20, 2014
Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotipF Houdellier, L de Knoop, C Gatel, et al.Pageof 458