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Ultramicroscopy|May 15, 2016
Angularly-selective transmission imaging in a scanning electron microscopeJason Holm, Robert R KellerUltramicroscopy|May 26, 2016
Efficient creation of electron vortex beams for high resolution STEM imagingA Béché, R Juchtmans, J VerbeeckUltramicroscopy|May 11, 2016
The role of transition radiation in cathodoluminescence imaging and spectroscopy of thin-foilsB G Mendis, A Howkins, D Stowe, et al.Ultramicroscopy|May 25, 2016
Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopyKnut Müller-Caspary, Florian F Krause, Tim Grieb, et al.Ultramicroscopy|September 10, 2014
Pore REconstruction and Segmentation (PORES) method for improved porosity quantification of nanoporous materialsG Van Eyndhoven, M Kurttepeli, C J Van Oers, et al.Ultramicroscopy|September 10, 2014
Characterization of an indirect X-ray imaging detector by simulation and experimentC Doshi, G van Riessen, E Balaur, et al.Ultramicroscopy|August 16, 2014
A correlative approach to segmenting phases and ferrite morphologies in transformation-induced plasticity steel using electron back-scattering diffraction and energy dispersive X-ray spectroscopyAzdiar A Gazder, Fayez Al-Harbi, Hendrik Th Spanke, et al.Ultramicroscopy|June 24, 2016
Monte Carlo modeling of ion beam induced secondary electronsU Huh, W Cho, D C JoyUltramicroscopy|July 5, 2016
On detector linearity and precision of beam shift detection for quantitative differential phase contrast applicationsJosef Zweck, Felix Schwarzhuber, Johannes Wild, et al.Ultramicroscopy|December 2, 2015
Characterizing the response of a scintillator-based detector to single electronsXiahan Sang, James M LeBeauPageof 460