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Ultramicroscopy|March 9, 2018
Multi-Mode Elastic Peak Electron Microscopy (MM-EPEM): A new imaging technique with an ultimate in-depth resolution for surface analysisMohamed Aymen Mahjoub, Guillaume Monier, Luc Bideux, et al.Ultramicroscopy|December 17, 2013
Generalization of the Matsumoto-Tonomura approximation for the phase shift within an open apertureRobert M Glaeser, Holger MüllerUltramicroscopy|December 24, 2013
Control of the higher eigenmodes of a microcantilever: applications in atomic force microscopyK S Karvinen, S O R MoheimaniUltramicroscopy|May 18, 2018
A consistent full-field integrated DIC framework for HR-EBSDT Vermeij, J P M HoefnagelsUltramicroscopy|July 6, 2018
Thermal nanometrology using piezoresistive SThM probes with metallic tipsPaweł Janus, Andrzej Sierakowski, Maciej Rudek, et al.Ultramicroscopy|November 18, 2005
Automated magnification calibration in transmission electron microscopy using Fourier analysis of replica imagesJeroen A W M van der Laak, Henry B P M Dijkman, Martin M M PahlplatzUltramicroscopy|October 21, 2009
Interpretation of O K-edge EELS in zircon using a structural variation approachNan Jiang, John C H SpenceUltramicroscopy|November 29, 2005
On the importance of fifth-order spherical aberration for a fully corrected electron microscopeL Y Chang, A I Kirkland, J M TitchmarshUltramicroscopy|December 6, 2005
Extraction of EELS white-line intensities of manganese compounds: methods, accuracy, and valence sensitivityT Riedl, T Gemming, K WetzigPageof 460