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Ultramicroscopy|July 6, 2018
Thermal nanometrology using piezoresistive SThM probes with metallic tipsPaweł Janus, Andrzej Sierakowski, Maciej Rudek, et al.Ultramicroscopy|November 18, 2005
Automated magnification calibration in transmission electron microscopy using Fourier analysis of replica imagesJeroen A W M van der Laak, Henry B P M Dijkman, Martin M M PahlplatzUltramicroscopy|October 21, 2009
Interpretation of O K-edge EELS in zircon using a structural variation approachNan Jiang, John C H SpenceUltramicroscopy|November 29, 2005
On the importance of fifth-order spherical aberration for a fully corrected electron microscopeL Y Chang, A I Kirkland, J M TitchmarshUltramicroscopy|December 6, 2005
Extraction of EELS white-line intensities of manganese compounds: methods, accuracy, and valence sensitivityT Riedl, T Gemming, K WetzigUltramicroscopy|September 5, 2018
Self-consistent atom probe tomography reconstructions utilizing electron microscopyDavid R Diercks, Brian P GormanUltramicroscopy|September 5, 2018
Quantitative analysis of backscattered electron (BSE) contrast using low voltage scanning electron microscopy (LVSEM) and its application to Al0.22Ga0.78N/GaN layersA Garitagoitia Cid, R Rosenkranz, M Löffler, et al.Ultramicroscopy|September 15, 2018
Advanced detector signal acquisition and electron beam scanning for high resolution SEM imagingWilliam C Lenthe, Jean Charles Stinville, McLean P Echlin, et al.Ultramicroscopy|August 13, 2018
Multifrequency Kelvin probe force microscopy on self assembled molecular layers and quantitative assessment of images' qualityDaniel Kopiec, Grzegorz Jóźwiak, Magdalena Moczała, et al.Ultramicroscopy|August 15, 2018
Chirality transitions and transport properties of individual few-walled carbon nanotubes as revealed by in situ TEM probingDai-Ming Tang, Dmitry G Kvashnin, Ovidiu Cretu, et al.Pageof 458