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Ultramicroscopy|March 5, 2010
Local crystal structure analysis with several picometer precision using scanning transmission electron microscopyKoji Kimoto, Toru Asaka, Xiuzhen Yu, et al.Ultramicroscopy|May 9, 2017
Detecting dynamic responses of materials and devices under an alternating electric potential by phase-locked transmission electron microscopyKentaro Soma, Stan Konings, Ryotaro Aso, et al.Ultramicroscopy|September 23, 2016
StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy imagesA De Backer, K H W van den Bos, W Van den Broek, et al.Ultramicroscopy|September 26, 2016
Wide-range tunable magnetic lens for tabletop electron microscopeWei-Yu Chang, Fu-Rong ChenUltramicroscopy|June 5, 2017
Preferred diffusion paths for copper electromigration by in situ transmission electron microscopyYoung-Hwa Oh, Sung-Il Kim, Miyoung Kim, et al.Ultramicroscopy|June 5, 2017
Optimized pre-thinning procedures of ion-beam thinning for TEM sample preparation by magnetorheological polishingHu Luo, Shaohui Yin, Guanhua Zhang, et al.Ultramicroscopy|June 14, 2017
Generation of electron vortex beams using line charges via the electrostatic Aharonov-Bohm effectGiulio Pozzi, Peng-Han Lu, Amir H Tavabi, et al.Ultramicroscopy|June 28, 2017
Characterisation of the Medipix3 detector for 60 and 80keV electronsJ A Mir, R Clough, R MacInnes, et al.Ultramicroscopy|December 1, 2009
Tomography of asymmetric bulk specimens imaged by scanning electron microscopyJ D Woodward, B T SewellUltramicroscopy|November 17, 2009
Kinetostatic model of spring constant ratios for an AFM cantilever with end extended massYakov M TseytlinPageof 460