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Ultramicroscopy|June 5, 2017
Optimized pre-thinning procedures of ion-beam thinning for TEM sample preparation by magnetorheological polishingHu Luo, Shaohui Yin, Guanhua Zhang, et al.Ultramicroscopy|June 14, 2017
Generation of electron vortex beams using line charges via the electrostatic Aharonov-Bohm effectGiulio Pozzi, Peng-Han Lu, Amir H Tavabi, et al.Ultramicroscopy|June 28, 2017
Characterisation of the Medipix3 detector for 60 and 80keV electronsJ A Mir, R Clough, R MacInnes, et al.Ultramicroscopy|December 1, 2009
Tomography of asymmetric bulk specimens imaged by scanning electron microscopyJ D Woodward, B T SewellUltramicroscopy|November 17, 2009
Kinetostatic model of spring constant ratios for an AFM cantilever with end extended massYakov M TseytlinUltramicroscopy|November 27, 2009
Dynamic behavior of amplitude detection Kelvin force microscopy in ultrahigh vacuumH Diesinger, D Deresmes, J-P Nys, et al.Ultramicroscopy|December 17, 2009
Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of siliconAimo Winkelmann, Gert NolzeUltramicroscopy|December 17, 2009
A framework for automatic segmentation in three dimensions of microstructural tomography dataP S Jørgensen, K V Hansen, R Larsen, et al.Ultramicroscopy|April 4, 2018
Spherical aberration correction in a scanning transmission electron microscope using a sculpted thin filmRoy Shiloh, Roei Remez, Peng-Han Lu, et al.Ultramicroscopy|July 10, 2017
High-throughput, semi-automated quantitative STEM mass measurement of supported metal nanoparticles using a conventional TEM/STEMStephen D House, Yuxiang Chen, Rongchao Jin, et al.Pageof 458