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Ultramicroscopy|August 21, 2021
An improved method assigning three-dimensional atomic potentials to multiple slices in exit-wave simulations of Transmission Electron MicroscopyK P Wu, B W Gao, F H Zhang, et al.Ultramicroscopy|December 6, 2025
Direct observation of meta-stable magnetization states in Fe/W(110) nanostructuresLei Yu, Weishi Wan, Xiaodong Yang, et al.Ultramicroscopy|December 11, 2025
Differentiation of distinct single atoms via multi‑defocus fusion methodYangfan Li, Yue Pan, Xincheng Lei, et al.Ultramicroscopy|November 27, 2025
Neural field enhanced phase retrieval of atomic-scale structural dynamics in radiation sensitive materialsYang Liu, Hongsheng Shi, Siyuan Shen, et al.Ultramicroscopy|January 21, 2026
Single photon emitters in hBN: Limitations of atomic resolution imaging and potential sources of errorDavid Lamprecht, Shrirang Chokappa, Alissa M Freilinger, et al.Ultramicroscopy|January 22, 2026
Towards large-area EELS mapping of precipitates in a steel matrix: Comparing low loss and high loss quantificationAlan J Craven, Bianca Sala, Ian MacLarenUltramicroscopy|December 19, 2025
Energy-resolved EBSD using a monolithic direct electron detectorNicolò M Della Ventura, Kalani Moore, McLean P Echlin, et al.Ultramicroscopy|November 8, 2025
An electrostatic aberration corrector for improved Low-Voltage SEM imagingDiederik Jan MaasUltramicroscopy|June 26, 2025
Transmission electron microscope with a mirror objective free of spherical and axial chromatic aberrationsS B Bimurzaev, Z S SautbekovaUltramicroscopy|June 24, 2025
Can low energy (1-20 eV) electron microscopy produce damage-free images of biological samples?Yi Zheng, Léon SanchePageof 458