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Ultramicroscopy|June 22, 2015
Brief history of the Cambridge STEM aberration correction project and its progenyL Michael Brown, Philip E Batson, Niklas Dellby, et al.
Ultramicroscopy|August 21, 2022
Field dependent study on the impact of co-evaporated multihits and ion pile-up for the apparent stoichiometric quantification of GaN and AlNRichard J H Morris, Ramya Cuduvally, Jhao-Rong Lin, et al.
Ultramicroscopy|June 14, 2020
Vector Potential Photoelectron Microscopy Instrument DesignR Browning
Ultramicroscopy|November 13, 2022
A new TCAD simulation method for direct CMOS electron detectors optimizationO Marcelot, C Marcelot, F Corbière, et al.
Ultramicroscopy|November 13, 2022
Quantitative analysis of mesoporous structures by electron tomography: A phantom studyXiaohui Huang, Dzmitry Hlushkou, Di Wang, et al.
Ultramicroscopy|August 21, 2021
An improved method assigning three-dimensional atomic potentials to multiple slices in exit-wave simulations of Transmission Electron MicroscopyK P Wu, B W Gao, F H Zhang, et al.
Ultramicroscopy|December 6, 2025
Direct observation of meta-stable magnetization states in Fe/W(110) nanostructuresLei Yu, Weishi Wan, Xiaodong Yang, et al.
Ultramicroscopy|December 11, 2025
Differentiation of distinct single atoms via multi‑defocus fusion methodYangfan Li, Yue Pan, Xincheng Lei, et al.
Ultramicroscopy|November 27, 2025
Neural field enhanced phase retrieval of atomic-scale structural dynamics in radiation sensitive materialsYang Liu, Hongsheng Shi, Siyuan Shen, et al.
Ultramicroscopy|January 21, 2026
Single photon emitters in hBN: Limitations of atomic resolution imaging and potential sources of errorDavid Lamprecht, Shrirang Chokappa, Alissa M Freilinger, et al.
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