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Ultramicroscopy|September 1, 2018
Integrated contrast-transfer-function for aberration-corrected phase-contrast STEMTakehito Seki, Naoto Takanashi, Eiji AbeUltramicroscopy|February 26, 2019
Empirical determination of transmission attenuation curves in mass-thickness contrast TEM imagingJun Yamasaki, Yuya Ubata, Hidehiro YasudaUltramicroscopy|December 17, 2019
Sub-100 nanosecond temporally resolved imaging with the Medipix3 direct electron detectorGary W Paterson, Raymond J Lamb, Rafael Ballabriga, et al.Ultramicroscopy|February 10, 2020
Fast-ADT: A fast and automated electron diffraction tomography setup for structure determination and refinementS Plana-Ruiz, Y Krysiak, J Portillo, et al.Ultramicroscopy|April 1, 1977
Advantages of megavolt electron microscopy in biological researchG DupouyUltramicroscopy|March 12, 2022
Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potentialChristoph Mahr, Tim Grieb, Florian F Krause, et al.Ultramicroscopy|February 26, 2022
The effect of post-acquisition data misalignments on the performance of STEM tomographyYi-Chi Wang, Zhong Lin WangUltramicroscopy|June 14, 2022
Elastic and inelastic mean free paths for scattering of fast electrons in thin-film oxidesAdham Basha, George Levi, Tamir Amrani, et al.Ultramicroscopy|July 5, 2022
The effect of secondary electrons on radiolysis as observed by in liquid TEM: The role of window material and electrical biasLindsey A Bultema, Robert Bücker, Eike C Schulz, et al.Ultramicroscopy|April 1, 1977
Prospects of three-dimensional high resolution electron microscopy of non-periodic structuresW Hoppe, B GrillPageof 460