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Phase Contrast and Differential Interference Contrast Microscopy01:26

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Phase-Contrast Microscopes
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...
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State-space representation is a powerful tool for simulating physical systems on digital computers, necessitating the conversion of the transfer function into state-space form. Consider an nth-order linear differential equation with constant coefficients, like those encountered in an RLC circuit. The state variables are selected as the output and its n−1 derivatives. Differentiating these variables and substituting them back into the original equation produces the state equations.
In an RLC...
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State Space to Transfer Function01:21

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The conversion of state-space representation to a transfer function is a fundamental process in system analysis. It provides a method for transitioning from a time-domain description to a frequency-domain representation, which is crucial for simplifying the analysis and design of control systems.
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Transfer function and Bode Plots-II01:23

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In the standard form, the transfer function is shown in constant gain, poles/zeros at origin, simple poles/zeros, and quadratic poles/zeros; each contributing uniquely to the system's overall response. The term represents the magnitude of the simple zero:
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Transfer function and Bode Plots-I01:19

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A transfer function presented in its standard form integrates elements' constant gain, the zeros, and poles at the origin, simple zeros and poles, and quadratic poles and zeros. The transfer function can be written as H(ω):
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The transfer function is a fundamental concept in the analysis and design of linear time-invariant (LTI) systems. It offers a concise way to understand how a system responds to different inputs in the frequency domain. It serves as a bridge between the time-domain differential equations that describe system dynamics and the frequency-domain representation that facilitates easier manipulation and analysis.
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Phase Contrast and Differential Interference Contrast DIC Microscopy
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Integrated contrast-transfer-function for aberration-corrected phase-contrast STEM.

Takehito Seki1, Naoto Takanashi2, Eiji Abe2

  • 1Institute of Engineering Innovation, University of Tokyo, Tokyo 113-8656, Japan.

Ultramicroscopy
|September 1, 2018
PubMed
Summary
This summary is machine-generated.

We introduce integrated contrast-transfer-function (iCTF) for aberration-corrected scanning transmission electron microscopy (STEM). This method accurately explains imaging of atomic sites and highlights potential artifacts in phase-contrast imaging.

Keywords:
Aberration correctionAnnular bright-field imagingContrast transfer functionPhase contrastScanning transmission electron microscopy

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Area of Science:

  • Materials Science
  • Microscopy
  • Physics

Background:

  • Aberration-corrected scanning transmission electron microscopy (STEM) offers high resolution, approaching specimen thickness limits.
  • Phase-contrast imaging in STEM requires understanding beam propagation through the specimen.

Purpose of the Study:

  • To define optical conditions for phase-contrast imaging in advanced STEM.
  • To introduce and validate the integrated contrast-transfer-function (iCTF) concept.

Main Methods:

  • Developing a theoretical framework for contrast transfer in thick specimens.
  • Applying the integrated contrast-transfer-function (iCTF) to analyze annular-bright-field (ABF) imaging.

Main Results:

  • The iCTF model accurately explains the behavior of heavy and light atomic sites under varying defocus.
  • Demonstrated depth-dependent imaging characteristics for different atomic sites.

Conclusions:

  • The iCTF concept is crucial for interpreting phase-contrast STEM images of thick specimens.
  • Identified potential artifacts arising from depth-dependent imaging, necessitating careful analysis.