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Ultramicroscopy|October 28, 2026
Electrostatic multipolar probe-forming objective lens for FIBLucile Berdou-Durrieu, Jean-Baptiste Mellier, Jean-Baptiste Fay, et al.Ultramicroscopy|October 28, 2026
Efficient large-scale STEM-EELS simulations with torched-TACAWMartin Osmera, João Vaz, Paul M Zeiger, et al.Ultramicroscopy|January 1, 1979
Reconstruction of a chromosome model from its projectionsG F Bahr, J A Boccia, W F Engler, et al.Ultramicroscopy|December 8, 2014
Efficient phase contrast imaging in STEM using a pixelated detector. Part II: optimisation of imaging conditionsHao Yang, Timothy J Pennycook, Peter D NellistUltramicroscopy|December 2, 2014
High-speed dynamic atomic force microscopy by using a Q-controlled cantilever eigenmode as an actuatorM BalantekinUltramicroscopy|December 2, 2014
Chirality determination of quartz crystals using electron backscatter diffractionAimo Winkelmann, Gert NolzeUltramicroscopy|October 18, 2015
On the validity of the Čerenkov limit as a criterion for precise band gap measurements by VEELSRolf ErniUltramicroscopy|October 18, 2015
Light propagation and interaction observed with electronsRobert C Word, J P S Fitzgerald, R KönenkampUltramicroscopy|October 23, 2015
Quantitative nanoscopy: Tackling sampling limitations in (S)TEM imaging of polymers and compositesKarthikeyan Gnanasekaran, Roderick Snel, Gijsbertus de With, et al.Ultramicroscopy|October 4, 2015
Modeling dynamical electron scattering with Bethe potentials and the scattering matrixA Wang, M De GraefPageof 460