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Ultramicroscopy|November 2, 2015
Why Principal Component Analysis of STEM spectrum-images results in "abstract", uninterpretable loadings?Pavel PotapovUltramicroscopy|June 21, 2016
Progress and new advances in simulating electron microscopy datasets using MULTEMI Lobato, S Van Aert, J VerbeeckUltramicroscopy|May 7, 2016
Measuring bandgap states in individual non-stoichiometric oxide nanoparticles using monochromated STEM EELS: The Praseodymium-ceria caseW J Bowman, K March, C A Hernandez, et al.Ultramicroscopy|April 1, 1989
Filtered dark-field and pure Z-contrast: two novel imaging modes in a Scanning Transmission Electron MicroscopeM HaiderUltramicroscopy|April 20, 2016
STEM image simulation with hybrid CPU/GPU programmingY Yao, B H Ge, X Shen, et al.Ultramicroscopy|April 24, 2016
Complete analysis of a transmission electron diffraction pattern of a MoS2-graphite heterostructureMarlene Adrian, Arne Senftleben, Silvio Morgenstern, et al.Ultramicroscopy|February 25, 2016
A FIB-nanotomography method for accurate 3D reconstruction of open nanoporous structuresK R Mangipudi, V Radisch, L Holzer, et al.Ultramicroscopy|March 4, 2016
Assessing strain mapping by electron backscatter diffraction and confocal Raman microscopy using wedge-indented SiLawrence H Friedman, Mark D Vaudin, Stephan J Stranick, et al.Ultramicroscopy|July 4, 2013
Estimation of unknown structure parameters from high-resolution (S)TEM images: what are the limits?A J den Dekker, J Gonnissen, A De Backer, et al.Pageof 460