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Ultramicroscopy|December 3, 2014
Quantitative use of electron energy-loss spectroscopy Mo-M2,3 edges for the study of molybdenum oxidesL Lajaunie, F Boucher, R Dessapt, et al.
Ultramicroscopy|December 30, 2014
Precisely detecting atomic position of atomic intensity imagesZhijun Wang, Yaolin Guo, Sai Tang, et al.
Ultramicroscopy|December 3, 2014
Solving protein nanocrystals by cryo-EM diffraction: multiple scattering artifactsGanesh Subramanian, Shibom Basu, Haiguang Liu, et al.
Ultramicroscopy|December 3, 2014
Designing a standard for strain mapping: HR-EBSD analysis of SiGe thin film structures on SiM D Vaudin, W A Osborn, L H Friedman, et al.
Ultramicroscopy|December 3, 2014
Imaging of tissue sections with very slow electronsL Frank, J Nebesářová, M Vancová, et al.
Ultramicroscopy|December 3, 2014
Framed carbon nanostructures: synthesis and applications in functional SPM tipsI S Mukhin, I V Fadeev, M V Zhukov, et al.
Ultramicroscopy|December 3, 2014
Enhanced quantification for 3D SEM-EDS: using the full set of available X-ray linesPierre Burdet, S A Croxall, P A Midgley
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