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Ultramicroscopy|February 9, 2016
GAGG:ce single crystalline films: New perspective scintillators for electron detection in SEMJan Bok, Ondřej Lalinský, Martin Hanuš, et al.
Ultramicroscopy|March 18, 2016
The effect of length scale on the determination of geometrically necessary dislocations via EBSD continuum dislocation microscopyT J Ruggles, T M Rampton, A Khosravani, et al.
Ultramicroscopy|December 1, 1989
Automatic selection of macromolecules from electron micrographs by component labelling and symbolic processingG Harauz, A Fong-Lochovsky
Ultramicroscopy|March 20, 2016
Nanopuller-open data acquisition platform for AFM force spectroscopy experimentsKonrad Pawlak, Janusz Strzelecki
Ultramicroscopy|April 1, 1989
Substrate properties affect the mass loss rate in collodion at liquid helium temperatureM K Lamvik, S D Davilla, L L Klatt
Ultramicroscopy|May 6, 2015
Methods for topography artifacts compensation in scanning thermal microscopyJan Martinek, Petr Klapetek, Anna Charvátová Campbell
Ultramicroscopy|July 30, 2016
Dose-rate-dependent damage of cerium dioxide in the scanning transmission electron microscopeAaron C Johnston-Peck, Joseph S DuChene, Alan D Roberts, et al.
Ultramicroscopy|December 7, 2024
Relativistic EELS scattering cross-sections for microanalysis based on Dirac solutionsZezhong Zhang, Ivan Lobato, Hamish Brown, et al.
Ultramicroscopy|December 2, 2024
State-of-the-art electron beams for compact tools of ultrafast sciencePeter Salén, Anatoliy Opanasenko, Giovanni Perosa, et al.
Ultramicroscopy|November 12, 2024
Toward quantitative thermoelectric characterization of (nano)materials by in-situ transmission electron microscopySimon Hettler, Mohammad Furqan, Andrés Sotelo, et al.
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