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Ultramicroscopy|June 18, 2017
Method for lateral force calibration in atomic force microscope using MEMS microforce sensorCezary Dziekoński, Wojciech Dera, Dariusz M Jarząbek
Ultramicroscopy|June 20, 2017
Functional NiTi grids for in situ straining in the TEMU Schürmann, C Chluba, N Wolff, et al.
Ultramicroscopy|September 20, 2016
Probe-diverse ptychographyI Peterson, R Harder, I K Robinson
Ultramicroscopy|September 20, 2016
A flexible method for the preparation of thin film samples for in situ TEM characterization combining shadow-FIB milling and electron-beam-assisted etchingJ P Liebig, M Göken, G Richter, et al.
Ultramicroscopy|September 23, 2016
Tilt series STEM simulation of a 25×25×25nm semiconductor with characteristic X-ray emissionR Aveyard, B Rieger
Ultramicroscopy|May 27, 2017
The usage of data compression for the background estimation of electron energy loss spectraJakob Spiegelberg, Ján Rusz, Klaus Leifer, et al.
Ultramicroscopy|June 11, 2017
Atomic resolution elemental mapping using energy-filtered imaging scanning transmission electron microscopy with chromatic aberration correctionF F Krause, A Rosenauer, J Barthel, et al.
Ultramicroscopy|June 24, 2017
Improved simulation based HR-EBSD procedure using image gradient based DIC techniquesJon Alkorta, Matthieu Marteleur, Pascal J Jacques
Ultramicroscopy|October 27, 2021
On 2D-FTIR-XRF microscopy - A step forward correlative tissue studies by infrared and hard X-ray radiationArtur D Surowka, Mateusz Czyzycki, Agata Ziomber-Lisiak, et al.
Ultramicroscopy|October 21, 2021
Correlation symmetry analysis of electron nanodiffraction from amorphous materialsShuoyuan Huang, Carter Francis, Jittisa Ketkaew, et al.
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