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Ultramicroscopy|November 17, 2023
Prediction of primary knock-on damage during electron microscopy characterization of lithium-containing materialsAli Jaberi, Nicolas Brodusch, Jun Song, et al.Ultramicroscopy|November 12, 2023
Reconstruction of Angstrom resolution exit-waves by the application of drift-corrected phase-shifting off-axis electron holographyJ Lindner, U Ross, T Meyer, et al.Ultramicroscopy|November 9, 2023
On central focusing for contrast optimization in direct electron ptychography of thick samplesC Gao, C Hofer, T J PennycookUltramicroscopy|September 16, 2023
Direct motif extraction from high resolution crystalline STEM imagesAmel Shamseldeen Ali Alhassan, Siyuan Zhang, Benjamin BerkelsUltramicroscopy|September 4, 2023
High pressure freezing and cryo-sectioning can be used for protein structure determination by electron diffractionChristine Moriscot, Guy Schoehn, Dominique HoussetUltramicroscopy|August 9, 2023
Comparative of machine learning classification strategies for electron energy loss spectroscopy: Support vector machines and artificial neural networksDaniel Del-Pozo-Bueno, Demie Kepaptsoglou, Francesca Peiró, et al.Ultramicroscopy|August 12, 2023
Mapping of lattice distortion in martensitic steel-Comparison of different evaluation methods of EBSD patternsGrzegorz Cios, Aimo Winkelmann, Gert Nolze, et al.Ultramicroscopy|August 13, 2023
Characterising the performance of an ultrawide field-of-view 3D atom probeLevi Tegg, Andrew J Breen, Siyu Huang, et al.Ultramicroscopy|August 24, 2023
Morphology measurements by AFM tapping without causing surface damage: A phase shift characterizationYang He, Yongda Yan, Yanquan GengUltramicroscopy|October 15, 2023
Real-time electron clustering in an event-driven hybrid pixel detectorJ Kuttruff, J Holder, Y Meng, et al.Pageof 460