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Ultramicroscopy|October 17, 2002
EMXtalOrg: an EM tilt data organization and processing systemJason McDermott, Eric BarklisUltramicroscopy|October 17, 2002
AFM structural study of the molecular chaperone GroEL and its two-dimensional crystals: an ideal "living" calibration sampleF Valle, J A DeRose, G Dietler, et al.Ultramicroscopy|October 17, 2002
Monitoring high-temperature solid-solid phase transitions of HMX with atomic force microscopyBrandon L Week, Chantel M Ruddle, Joseph M Zaug, et al.Ultramicroscopy|December 20, 2002
A comparison of EDS microanalysis in FIB-prepared and electropolished TEM thin foilsC R Hutchinson, R E Hackenberg, G J ShifletUltramicroscopy|December 21, 2002
Imaging of the boron doping in silicon using low energy SEMIlona Müllerová, Mohamed M El-Gomati, Ludĕk FrankUltramicroscopy|December 21, 2002
Simulation methods for multipole imaging systems and aberration correctorsHaoning Liu, Eric Munro, John Rouse, et al.Ultramicroscopy|July 26, 2002
Bias-induced forces in conducting atomic force microscopy and contact charging of organic monolayersX D Cui, X Zarate, J Tomfohr, et al.Pageof 460