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Ultramicroscopy|November 12, 2002
Mapping the mesoscale interface structure in polycrystalline materialsC T Wu, B L Adams, C L Bauer, et al.Ultramicroscopy|November 12, 2002
Atomic configuration in core structure of Lomer dislocation in Si0.76Ge0.24/SiD Wang, H Chen, F H Li, et al.Ultramicroscopy|July 1, 1975
Superposition of chromatic error and beam broadening in transmission electron microscopy of thick carbon and organic specimensL Reimer, P GentschUltramicroscopy|July 1, 1975
Thick specimens in the CEM and STEM. Resolution and image formationT GrovesUltramicroscopy|July 1, 1975
The microanalysis of light elements using transmitted energy loss electronsM IsaacsonUltramicroscopy|December 1, 1975
Magnification variations in reflection electron microscopy using diffracted beamsJ M Cowley, P E NielsenUltramicroscopy|December 1, 1975
Averaging of low exposure electron micrographs of non-periodic objectsJ FrankUltramicroscopy|September 5, 2002
Mechanical property measurements of nanoscale structures using an atomic force microscopeSriram Sundararajan, Bharat Bhushan, Takahiro Namazu, et al.Ultramicroscopy|September 5, 2002
Observation of recording pits on phase-change film using a scanning probe microscopeToshiya Nishimura, Masato Iyoki, Shoji SadayamaUltramicroscopy|September 5, 2002
Scanning surface potential microscopic studies of photo-voltaic Langmuir-Blodgett assemblies containing an A-S-D triad moleculeM Sakomura, T Oono, R Sakon, et al.Pageof 460