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Ultramicroscopy|November 16, 2020
Influence of field conditions on quantitative analysis of single crystal thorium dioxide by atom probe tomographyAmrita Sen, Mukesh Bachhav, Francois Vurpillot, et al.Ultramicroscopy|November 8, 2020
A cartridge-based turning specimen holder with wireless tilt angle measurement for magnetic induction mapping in the transmission electron microscopePatrick Diehle, András Kovács, Thomas Duden, et al.Ultramicroscopy|November 1, 2020
Local electronic transport across probe/ionic conductor interface in scanning probe microscopyK N Romanyuk, D O Alikin, B N Slautin, et al.Ultramicroscopy|September 8, 2020
Enhancement of low-spatial-frequency components by a new phase-contrast STEM using a probe formed with an amplitude Fresnel zone plateMasato Tomita, Yukinori Nagatani, Kazuyoshi Murata, et al.Ultramicroscopy|October 15, 2020
Origin and Suppression of Beam Damage-Induced Oxygen-K Edge Artifact from γ-Al2O3 using Cryo-EELSHenry O Ayoola, Cheng-Han Li, Stephen D House, et al.Ultramicroscopy|November 20, 2019
Patterned probes for high precision 4D-STEM bragg measurementsSteven E Zeltmann, Alexander Müller, Karen C Bustillo, et al.Ultramicroscopy|February 2, 2020
A new approach for repeated tip-sample relocation for AFM imaging of nano and micro sized particles and cells in liquid environmentAbd Alaziz Abu Quba, Gabriele E Schaumann, Mariam Karagulyan, et al.Ultramicroscopy|January 26, 2020
Beam displacement and blur caused by fast electron beam deflectionLixin Zhang, Mathijs W H Garming, Jacob P Hoogenboom, et al.Ultramicroscopy|March 4, 2020
Molecular dynamics simulation of bimodal atomic force microscopyZhipeng Dou, Jianqiang Qian, Yingzi Li, et al.Ultramicroscopy|January 20, 2019
Direct comparison of off-axis holography and differential phase contrast for the mapping of electric fields in semiconductors by transmission electron microscopyBenedikt Haas, Jean-Luc Rouvière, Victor Boureau, et al.Pageof 460