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Ultramicroscopy|November 5, 2021
Integrated wafer-scale manufacturing of electron cryomicroscopy specimen supportsKaterina Naydenova, Christopher J Russo
Ultramicroscopy|December 20, 2021
Large volume tomography using plasma FIB-SEM: A comprehensive case study on black siliconYu Zhang, Charlie Kong, Giuseppe Scardera, et al.
Ultramicroscopy|December 16, 2021
Sub-Sampled Imaging for STEM: Maximising Image Speed, Resolution and Precision Through Reconstruction Parameter RefinementDaniel Nicholls, Jack Wells, Andrew Stevens, et al.
Ultramicroscopy|December 16, 2021
Quantitative nanoscale imaging using transmission He ion channelling contrast: Proof-of-concept and application to study isolated crystalline defectsSaba Tabean, Michael Mousley, Christoph Pauly, et al.
Ultramicroscopy|November 20, 2021
Orientation, pattern center refinement and deformation state extraction through global optimization algorithmsChaoyi Zhu, Christian Kurniawan, Marcus Ochsendorf, et al.
Ultramicroscopy|February 18, 2019
Multifrequency nanoscale impedance microscopy (m-NIM): A novel approach towards detection of selective and subtle modifications on the surface of polycrystalline boron-doped diamond electrodesArtur Zielinski, Mateusz Cieslik, Michal Sobaszek, et al.
Ultramicroscopy|February 18, 2019
Design and simulation of a linear electron cavity for quantum electron microscopyMarco Turchetti, Chung-Soo Kim, Richard Hobbs, et al.
Ultramicroscopy|February 19, 2019
Comparison of different imaging models handling partial coherence for aberration-corrected HRTEM at 40-80 kVZ Lee, T Lehnert, U Kaiser, et al.
Ultramicroscopy|August 31, 2019
On the resolution of EBSD across atomic density and accelerating voltage with a particular focus on the light metal magnesiumAbhishek Tripathi, Stefan Zaefferer
Ultramicroscopy|October 7, 2019
A new method for measuring nanoparticle diameter from a set of SEM images using a remarkable pointLoïc Crouzier, Alexandra Delvallée, Sébastien Ducourtieux, et al.
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