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Ultramicroscopy|April 26, 2017
The impact of STEM aberration correction on materials scienceStephen J Pennycook
Ultramicroscopy|May 2, 2017
Atom probe tomography analysis of SiGe fins embedded in SiO2: Facts and artefactsD Melkonyan, C Fleischmann, L Arnoldi, et al.
Ultramicroscopy|September 13, 2016
Resonance frequencies of AFM cantilevers in contact with a surfaceG J Verbiest, M J Rost
Ultramicroscopy|May 20, 2017
Work function characterization of directionally solidified LaB6-VB2 eutecticTyson C Back, Andreas K Schmid, Steven B Fairchild, et al.
Ultramicroscopy|May 21, 2017
AFM reconstruction of complex-shaped chiral plasmonic nanostructuresA V Kondratov, O Y Rogov, R V Gainutdinov
Ultramicroscopy|May 10, 2017
Atomic force phase imaging for dynamic detection of adsorbed hydrogen on a catalytic palladium surface under liquidMatthew J Young, Jared C Carson, Peter H Pfromm, et al.
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