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Ultramicroscopy|April 8, 2018
Optimal sampling and reconstruction of undersampled atomic force microscope images using compressive sensingGuoqiang Han, Bo LinUltramicroscopy|April 17, 2018
Measurements of the energy distribution of a high brightness rubidium ion beamG Ten Haaf, S H W Wouters, D F J Nijhof, et al.Ultramicroscopy|June 16, 2018
Dr. Probe: A software for high-resolution STEM image simulationJ BarthelUltramicroscopy|June 11, 2018
Gaining sight after being blind: A tribute to Jing ZhuJeff Th M De HossonUltramicroscopy|June 17, 2018
SDVSRM - a new SSRM based technique featuring dynamically adjusted, scanner synchronized sample voltages for measurement of actively operated devicesStefan Doering, Andre Wachowiak, Hagen Roetz, et al.Ultramicroscopy|June 19, 2018
Quasi-parallel precession diffraction: Alignment method for scanning transmission electron microscopesS Plana-Ruiz, J Portillo, S Estradé, et al.Ultramicroscopy|May 31, 2017
FIB based fabrication of an operative Pt/HfO2/TiN device for resistive switching inside a transmission electron microscopeA Zintler, U Kunz, Y Pivak, et al.Ultramicroscopy|September 8, 2018
Composition dependence of penetration range and backscattering coefficient of electrons impinging on SixGe1-x and GaAsxN1-x semiconducting alloysM Ajmal Khan, H Algarni, N Bouarissa, et al.Ultramicroscopy|July 1, 2018
Impact of the electron beam on the thermal stability of gold nanorods studied by environmental transmission electron microscopyWiebke Albrecht, Arjen van de Glind, Hideto Yoshida, et al.Ultramicroscopy|May 27, 2019
Planck's generalised radiation law and its implications for cathodoluminescence spectraB G MendisPageof 460