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Ultramicroscopy|September 22, 2000
Topographic and phase-contrast imaging in atomic force microscopyPang, Baba-Kishi, PatelUltramicroscopy|October 3, 2000
A new phase consistency criterion and its application in electron crystallographyHe, Carazo, FernandezUltramicroscopy|June 7, 2000
Structure analysis by diffraction of amorphous zones created by Ni ion implantation into pure AlCuenat, Schaublin, Hessler-Wyser, et al.Ultramicroscopy|May 11, 2000
Shear force distance control in near-field optical microscopy: experimental evidence of the frictional probe-sample interactionLapshin, Kobylkin, LetokhovUltramicroscopy|May 11, 2000
Impact of column bending in high-resolution transmission electron microscopy on the strain evaluation of GaAs/InAs/GaAs heterostructuresTillmann, Lentzen, RosenfeldUltramicroscopy|March 31, 2000
Piezoresistive sensors for scanning probe microscopyGotszalk, Grabiec, RangelowUltramicroscopy|March 31, 2000
Analysis of failure mechanisms in electrically stressed gold nanowiresDurkan, WellandUltramicroscopy|March 31, 2000
AFM characterization of domain structure of ferroelectric TGS crystals on a nanoscaleTolstikhina, Belugina, ShikinPageof 460