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Ultramicroscopy
|
December 1, 1993
Telemicroscopy
G Y Fan, P J Mercurio, S J Young, et al.
Ultramicroscopy
|
September 1, 1976
Use of coincidence techniques to improve the detection limits of electron spectroscopy in STEM
D B Wittry
Ultramicroscopy
|
December 1, 1976
Measurement of focus and spherical aberration of an electron microscope objective lens
T F Budinger, R M Glaeser
Ultramicroscopy
|
April 24, 1999
CART: a controlled algebraic reconstruction technique for electron microscope tomography of embedded, sectioned specimen
R Jonges, P N Boon, J van Marle, et al.
Ultramicroscopy
|
August 17, 2000
A simple and fast TEM preparation method utilizing the pre-orientation in plate-like, needle-shaped and tubular materials
Muller, Krumeich
Ultramicroscopy
|
August 17, 2000
On the calculation of the phase shift of superconducting fluxons: from the isolated to the lattice case
Beleggia, Pozzi
Ultramicroscopy
|
August 17, 2000
The spatial resolution of 3D atom probe in the investigation of single-phase materials
Vurpillot, Bostel, Cadel, et al.
Ultramicroscopy
|
September 22, 2000
Topographic and phase-contrast imaging in atomic force microscopy
Pang, Baba-Kishi, Patel
Ultramicroscopy
|
October 3, 2000
A new phase consistency criterion and its application in electron crystallography
He, Carazo, Fernandez
Ultramicroscopy
|
June 7, 2000
Structure analysis by diffraction of amorphous zones created by Ni ion implantation into pure Al
Cuenat, Schaublin, Hessler-Wyser, et al.
Page
of 475
Search research articles
Search
Showing results (251-260 of 4,742) with videos related to
Sort By:
Page
of 475
Ultramicroscopy
|
December 1, 1993
Telemicroscopy
G Y Fan, P J Mercurio, S J Young, et al.
Ultramicroscopy
|
September 1, 1976
Use of coincidence techniques to improve the detection limits of electron spectroscopy in STEM
D B Wittry
Ultramicroscopy
|
December 1, 1976
Measurement of focus and spherical aberration of an electron microscope objective lens
T F Budinger, R M Glaeser
Ultramicroscopy
|
April 24, 1999
CART: a controlled algebraic reconstruction technique for electron microscope tomography of embedded, sectioned specimen
R Jonges, P N Boon, J van Marle, et al.
Ultramicroscopy
|
August 17, 2000
A simple and fast TEM preparation method utilizing the pre-orientation in plate-like, needle-shaped and tubular materials
Muller, Krumeich
Ultramicroscopy
|
August 17, 2000
On the calculation of the phase shift of superconducting fluxons: from the isolated to the lattice case
Beleggia, Pozzi
Ultramicroscopy
|
August 17, 2000
The spatial resolution of 3D atom probe in the investigation of single-phase materials
Vurpillot, Bostel, Cadel, et al.
Ultramicroscopy
|
September 22, 2000
Topographic and phase-contrast imaging in atomic force microscopy
Pang, Baba-Kishi, Patel
Ultramicroscopy
|
October 3, 2000
A new phase consistency criterion and its application in electron crystallography
He, Carazo, Fernandez
Ultramicroscopy
|
June 7, 2000
Structure analysis by diffraction of amorphous zones created by Ni ion implantation into pure Al
Cuenat, Schaublin, Hessler-Wyser, et al.
Page
of 475