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Ultramicroscopy|September 22, 2000
A new way of measuring microscope aberrationsSaxton
Ultramicroscopy|September 22, 2000
Atomic-focuser imaging in electron nanodiffraction from carbon nanoshellsCowley
Ultramicroscopy|October 3, 2000
Selective specimen preparation for TEM observation of the cross-section of individual carbon nanotube/metal junctionsWei, Kohler-Redlich, Bader, et al.
Ultramicroscopy|August 17, 2000
Structure determination of phi-Bi8Pb5O17 by electron and powder X-ray diffractionGemmi, Righi, Calestani, et al.
Ultramicroscopy|August 17, 2000
New concept of information resolution in scanning electron microscope imagesIshitani, Sato
Ultramicroscopy|June 1, 1976
The use of backscattered electrons for imaging purposes in a scanning electron microscopeA V Crewe, P S Lin
Ultramicroscopy|June 1, 1976
The formation and interpretation of defect images from crystalline materials in a scanning transmission electron microscopeD M Maher, D C Joy
Ultramicroscopy|June 1, 1976
Very low voltage electron microscopyA V Crewe
Ultramicroscopy|September 1, 1976
Radiation damage of proteins in the solid state: changes of amino acid composition in catalaseW Baumeister, M Hahn, J Seredynski, et al.
Ultramicroscopy|December 1, 1976
Use of pure carbon specimen holders for analytical electron microscopy of thin sectionsB Liljesvan, G M Roomans
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