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Ultramicroscopy|December 17, 2010
The effect of amorphous carbon layer on the field emission characteristics of carbon nanotube filmYu Zhang, J L Du, J H Xu, et al.Ultramicroscopy|December 28, 2010
Implementation of Gold deconvolution for enhanced energy resolution in EEL spectraStaffan Wachtmeister, Stefan CsillagUltramicroscopy|December 28, 2010
Images of paraffin monolayer crystals with perfect contrast: minimization of beam-induced specimen motionR M Glaeser, G McMullan, A R Faruqi, et al.Ultramicroscopy|December 28, 2010
A simple algorithm for measuring particle size distributions on an uneven background from TEM imagesLionel Cervera Gontard, Dogan Ozkaya, Rafal E Dunin-BorkowskiUltramicroscopy|December 28, 2010
Quantification of the lateral detachment force for bacterial cells using atomic force microscope and centrifugationTong Zhang, Yuanqing Chao, Kaimin Shih, et al.Ultramicroscopy|December 28, 2010
A method for accurate localisation of EBSD pattern centresClaire Maurice, Krzysztof Dzieciol, Roland FortunierUltramicroscopy|December 28, 2010
Atomic imaging using secondary electrons in a scanning transmission electron microscope: experimental observations and possible mechanismsH Inada, D Su, R F Egerton, et al.Ultramicroscopy|January 11, 2011
Pulsed-laser atom probe studies of a precipitation hardened maraging TRIP steelO Dmitrieva, P Choi, S S A Gerstl, et al.Ultramicroscopy|July 12, 2011
The beam divergence of an indium LMIS at a distance of 50 μm as determined by plasma diagnostic measurementsI Vasiljevich, M TajmarPageof 460