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Ultramicroscopy|July 3, 2004
A torsional resonance mode AFM for in-plane tip surface interactionsLin Huang, Chanmin Su
Ultramicroscopy|July 3, 2004
Tip-to-sample distance dependence of an electrostatic force in KFM measurementsTakuji Takahashi, Shiano Ono
Ultramicroscopy|July 3, 2004
Investigation of the surface structure and elastic properties of calcium silicate hydrates at the nanoscaleCédric Plassard, Eric Lesniewska, Isabelle Pochard, et al.
Ultramicroscopy|July 3, 2004
Characterization of self-assembling isolated ferroelectric domains by scanning force microscopyBongki Lee, Changdeuck Bae, Seung-Hyun Kim, et al.
Ultramicroscopy|July 3, 2004
Applications of field-enhanced near-field optical microscopyA Bouhelier, M R Beversluis, L Novotny
Ultramicroscopy|July 3, 2004
Near-field magneto-optical analysis in reflection mode SNOMSatoshi Takahashi, Wayne Dickson, Robert Pollard, et al.
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