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Ultramicroscopy|October 17, 2009
Application of image processing to STEM tomography of low-contrast materialsV Ortalan, M Herrera, D G Morgan, et al.Ultramicroscopy|September 28, 2014
Effect of the asymmetry of dynamical electron diffraction on intensity of acquired EMCD signalsDongsheng Song, Ziqiang Wang, Jing ZhuUltramicroscopy|December 10, 2014
Vibrational and optical spectroscopies integrated with environmental transmission electron microscopyMatthieu Picher, Stefano Mazzucco, Steve Blankenship, et al.Ultramicroscopy|December 16, 2014
Transmission environmental scanning electron microscope with scintillation gaseous detection deviceGerasimos Danilatos, Mary Kollia, Vassileios DracopoulosUltramicroscopy|December 17, 2014
Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-countingA De Backer, G T Martinez, K E MacArthur, et al.Ultramicroscopy|August 22, 2017
High-efficiency detector of secondary and backscattered electrons for low-dose imaging in the ESEMVilém Neděla, Eva Tihlaříková, Jiří Runštuk, et al.Ultramicroscopy|August 25, 2017
Characterization of trapped charges distribution in terms of mirror plot curveHassan N Al-Obaidi, Ali S Mahdi, Imad H KhaleelUltramicroscopy|August 12, 2017
Subsampling and inpainting approaches for electron tomographyToby Sanders, Christian DwyerUltramicroscopy|August 26, 2017
Improving microstructural quantification in FIB/SEM nanotomographyJoshua A Taillon, Christopher Pellegrinelli, Yi-Lin Huang, et al.Ultramicroscopy|September 29, 2015
Self-adapting denoising, alignment and reconstruction in electron tomography in materials scienceTony Printemps, Guido Mula, Daniele Sette, et al.Pageof 460