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Ultramicroscopy|January 1, 2019
Electron energy-loss spectroscopy (EELS) with a cold-field emission scanning electron microscope at low accelerating voltage in transmission modeNicolas Brodusch, Hendrix Demers, Alexandra Gellé, et al.
Ultramicroscopy|November 27, 2018
Complementary cathodoluminescence lifetime imaging configurations in a scanning electron microscopeS Meuret, M Solà Garcia, T Coenen, et al.
Ultramicroscopy|November 19, 2019
Nanoscale temperature measurement during temperature controlled in situ TEM using Al plasmon nanothermometryA Chmielewski, C Ricolleau, D Alloyeau, et al.
Ultramicroscopy|February 11, 2019
Capabilities of the Falcon III detector for single-particle structure determinationBoyuan Song, Julian Lenhart, Vanessa Judith Flegler, et al.
Ultramicroscopy|November 29, 2017
Clustering analysis strategies for electron energy loss spectroscopy (EELS)Pau Torruella, Marta Estrader, Alberto López-Ortega, et al.
Ultramicroscopy|January 15, 2019
Analysis of a capped carbon nanotube by linear-scaling density-functional theoryC J Edgcombe, S M Masur, E B Linscott, et al.
Ultramicroscopy|January 15, 2019
In situ TEM mechanical characterization of one-dimensional nanostructures via a standard double-tilt holder compatible MEMS deviceYang Yang, Zhengqian Fu, Xiao Zhang, et al.
Ultramicroscopy|January 1, 1988
Microtomography from limited projections in conventional TEM for 3D reconstruction of an intact cellA C Nelson, W M Hobbib
Ultramicroscopy|December 30, 2019
Multi-modal and multi-scale non-local means method to analyze spectroscopic datasetsNiklas Mevenkamp, Katherine E MacArthur, Vasiliki Tileli, et al.
Ultramicroscopy|March 20, 2018
High quality ultrafast transmission electron microscopy using resonant microwave cavitiesW Verhoeven, J F M van Rens, E R Kieft, et al.
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