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Ultramicroscopy|November 15, 2017
Variation of field enhancement factor near the emitter tipDebabrata Biswas, Gaurav Singh, Shreya G Sarkar, et al.
Ultramicroscopy|December 2, 2017
Electron-beam broadening in amorphous carbon films in low-energy scanning transmission electron microscopyH Drees, E Müller, M Dries, et al.
Ultramicroscopy|November 28, 2017
Third-rank chromatic aberrations of electron lensesZhixiong Liu
Ultramicroscopy|December 15, 2017
Wet-chemical etching of atom probe tips for artefact free analyses of nanoscaled semiconductor structuresD Melkonyan, C Fleischmann, A Veloso, et al.
Ultramicroscopy|December 16, 2017
Atomic force microscopy capable of vibration isolation with low-stiffness Z-axis actuationShingo Ito, Georg Schitter
Ultramicroscopy|September 16, 2017
Multiple beam ptychography for large field-of-view, high throughput, quantitative phase contrast imagingCharles Bevis, Robert Karl, Jonathan Reichanadter, et al.
Ultramicroscopy|November 7, 2017
Reprint of Low-energy electron potentiometryJohannes Jobst, Jaap Kautz, Maria Mytiliniou, et al.
Ultramicroscopy|February 8, 2018
Ewald sphere correction using a single side-band image processing algorithmChristopher J Russo, Richard Henderson
Ultramicroscopy|February 8, 2018
Microscopic charge fluctuations cause minimal contrast loss in cryoEMChristopher J Russo, Richard Henderson
Ultramicroscopy|February 8, 2018
In situ electrochemical AFM monitoring of the potential-dependent deterioration of platinum catalyst during potentiodynamic cyclingIvan Khalakhan, Andrei Choukourov, Mykhailo Vorokhta, et al.
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