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Ultramicroscopy|July 18, 2009
Fast three-dimensional nanoscale metrology in dual-beam FIB-SEM instrumentationLuca Repetto, Renato Buzio, Carlo Denurchis, et al.Ultramicroscopy|July 7, 2009
Fourier-ratio deconvolution techniques for electron energy-loss spectroscopy (EELS)Feng Wang, Ray Egerton, Marek MalacUltramicroscopy|August 14, 2009
Indentation modulus and hardness of viscoelastic thin films by atomic force microscopy: A case studyD Passeri, A Bettucci, A Biagioni, et al.Ultramicroscopy|November 18, 2008
Preparation of location-specific thin foils from Fe-3% Si bi- and tri-crystals for examination in a FEG-STEMF Sorbello, G M Hughes, P Lejcek, et al.Ultramicroscopy|April 3, 2009
Atomic-scale redistribution of Pt during reactive diffusion in Ni (5% Pt)-Si contactsO Cojocaru-Mirédin, E Cadel, D Blavette, et al.Ultramicroscopy|April 4, 2009
Visualization of magnetic domains by near-field scanning microwave microscopeKiejin Lee, Harutyun Melikyan, Arsen Babajanyan, et al.Ultramicroscopy|April 7, 2009
Electrical detection of beta-amyloid (1-40) using scanning tunneling microscopyJin-Ho Lee, Da-Yeon Kang, Sang-Uk Kim, et al.Ultramicroscopy|September 28, 2007
Study of the nanoscopic deformation of an annealed nafion film by using atomic force microscopy and a patterned substrateYuta Maeda, Yanfeng Gao, Masayuki Nagai, et al.Ultramicroscopy|June 28, 2008
Dynamical effects of anisotropic inelastic scattering in electron backscatter diffractionAimo WinkelmannUltramicroscopy|June 27, 2008
Resolution enhancing using cantilevered tip-on-aperture silicon probe in scanning near-field optical microscopyWon-Seok Chang, Sven Bauerdick, Mun Seok JeongPageof 460