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Ultramicroscopy|November 11, 2008
In situ electron backscattered diffraction of individual GaAs nanowiresS V Prikhodko, S Sitzman, V Gambin, et al.Ultramicroscopy|December 3, 2008
Exploration of the ultimate patterning potential achievable with focused ion beamsJ Gierak, E Bourhis, G Faini, et al.Ultramicroscopy|December 17, 2008
High-field versus high-pressure: weakly adsorbed CO species on Pt(111)Yuri Suchorski, Wolfgang Drachsel, Günther RupprechterUltramicroscopy|August 22, 2008
Measurement method of aberration from Ronchigram by autocorrelation functionH Sawada, T Sannomiya, F Hosokawa, et al.Ultramicroscopy|October 28, 2008
Quantitative structural analysis of twin boundary in alpha-Zn7Sb2O12 using HAADF STEM methodKoji Kuramochi, Kentaro Suzuki, Takashi Yamazaki, et al.Ultramicroscopy|October 25, 2008
Data scattering in scanning tunneling spectroscopyN Severin, S Groeper, R Kniprath, et al.Ultramicroscopy|August 30, 2005
Nanoscale electrical characterization of semiconducting polymer blends by conductive atomic force microscopy (C-AFM)A Alexeev, J Loos, M M KoetseUltramicroscopy|August 30, 2005
Rapid structure determination of a metal oxide from pseudo-kinematical electron diffraction dataC S Own, W Sinkler, L D MarksUltramicroscopy|August 30, 2005
An expanded approach to noise reduction from high-resolution STEM images based on the maximum entropy methodNobuto Nakanishi, Yasutoshi Kotaka, Takashi YamazakiUltramicroscopy|August 23, 2005
Conductive transparent fiber probes for shear-force atomic force microscopesTooru MurashitaPageof 460