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Ultramicroscopy|January 1, 1991
An electronic image drift compensator for electron microscopyD Cattermole, R HendersonUltramicroscopy|September 14, 2010
Experimental and theoretical study of electron density and structure factors in CoSb₃R Sæterli, E Flage-Larsen, J Friis, et al.Ultramicroscopy|September 14, 2010
Bloch wave symmetries in electron diffraction: applications to Friedels law, Gjonnes-Moodie lines and refraction at interfacesK Valset, J TaftoUltramicroscopy|January 29, 2011
Effect of laser power and specimen temperature on atom probe analyses of magnesium alloysK Oh-ishi, C L Mendis, T Ohkubo, et al.Ultramicroscopy|January 21, 2011
Ordering and site occupancy of D03 ordered Fe3Al-5 at%Cr evaluated by means of atom probe tomographyThomas Rademacher, Talaat Al-Kassab, Johannes Deges, et al.Ultramicroscopy|November 6, 2010
Precession electron diffraction using a digital sampling methodDaliang Zhang, Daniel Grüner, Peter Oleynikov, et al.Ultramicroscopy|November 6, 2010
Practical implementation of a direct method for coherent diffractive imagingA V Martin, A I Bishop, D M Paganin, et al.Ultramicroscopy|November 30, 2010
Surface electronic structure of Ti-covered W(111) by photofield emissionP Hadzel, L Jurczyszyn, R KucharczykUltramicroscopy|November 30, 2010
Aberration measurement in HRTEM: implementation and diagnostic use of numerical procedures for the highly precise recognition of diffractogram patternsJ Barthel, A ThustPageof 459