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Ultramicroscopy|June 1, 1991
Improved transfer of two-dimensional crystals from the air/water interface to specimen support grids for high-resolution analysis by electron microscopyE W Kubalek, R D Kornberg, S A DarstUltramicroscopy|March 10, 2009
The morphology of secondary-hardening carbides in a martensitic steel at the peak hardness by 3DFIMJ Akré, F Danoix, H Leitner, et al.Ultramicroscopy|March 10, 2009
Immobilizing live bacteria for AFM imaging of cellular processesL Kailas, E C Ratcliffe, E J Hayhurst, et al.Ultramicroscopy|March 10, 2009
Burgers vector determination in deformed perovskite and post-perovskite of CaIrO(3) using thickness fringes in weak-beam dark-field imagesNobuyoshi Miyajima, Nicolas WalteUltramicroscopy|March 10, 2009
"Ab initio" structure solution from electron diffraction data obtained by a combination of automated diffraction tomography and precession techniqueE Mugnaioli, T Gorelik, U KolbUltramicroscopy|June 13, 2009
Bragg's Law diffraction simulations for electron backscatter diffraction analysisJosh Kacher, Colin Landon, Brent L Adams, et al.Ultramicroscopy|March 24, 2009
Behaviour of TEM metal grids during in-situ heating experimentsZaoli Zhang, Dangsheng SuUltramicroscopy|June 6, 2009
Measurement of specimen thickness and composition in Al(x)Ga(1-x)N/GaN using high-angle annular dark field imagesAndreas Rosenauer, Katharina Gries, Knut Müller, et al.Ultramicroscopy|June 6, 2009
Detective quantum efficiency of electron area detectors in electron microscopyG McMullan, S Chen, R Henderson, et al.Ultramicroscopy|June 23, 2009
An improved ptychographical phase retrieval algorithm for diffractive imagingAndrew M Maiden, John M RodenburgPageof 460