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Ultramicroscopy|June 26, 2009
Complementary techniques for the characterization of thin film Ti/Nb multilayersArda Genç, Rajarshi Banerjee, Gregory B Thompson, et al.
Ultramicroscopy|June 16, 2009
Bloch-wave-based STEM image simulation with layer-by-layer representationTakao Morimura, Masayuki Hasaka
Ultramicroscopy|June 16, 2009
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopyS Van Aert, J Verbeeck, R Erni, et al.
Ultramicroscopy|July 7, 2009
An efficient approach to characterize pseudo-merohedral twins by precession electron diffraction: application to the LaGaO(3) perovskiteG Ji, J-P Morniroli, G J Auchterlonie, et al.
Ultramicroscopy|January 6, 2009
Atomic force microscopy characterization of the chemical contrast of nanoscale patterns fabricated by electron beam lithography on polyethylene glycol oxide thin filmsLucel Sirghi, Frederic Bretagnol, Stéphane Mornet, et al.
Ultramicroscopy|January 24, 2009
A high-speed area detector for novel imaging techniques in a scanning transmission electron microscopeT A Caswell, P Ercius, M W Tate, et al.
Ultramicroscopy|January 24, 2009
QD as a bifunctional cell-surface marker for both fluorescence and atomic force microscopyYunqi Wang, Yong Chen, Jiye Cai, et al.
Ultramicroscopy|January 28, 2009
A new approach for explanation of specimen rupture under high electric fieldI M Mikhailovskij, N Wanderka, V E Storizhko, et al.
Ultramicroscopy|January 28, 2009
Fabrication and field emission properties of boron nanowire bundlesFei Liu, W J Liang, Z J Su, et al.
Ultramicroscopy|December 27, 2008
Damages of screen-printed carbon nanotube cold cathode during the field emission processGeng Zhang, Jun Chen, S Z Deng, et al.
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