Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Long-term outcomes and treatment response in early-stage invasive lobular carcinoma: insights from a nationwide population-based study.

ESMO open·2026
Same author

Fast STEM image simulation in low-energy transmission electron microscopy by the accurate Chen-van-Dyck multislice method.

Micron (Oxford, England : 1993)·2024
Same author

Older adults' compliance with mobile ecological momentary assessments in behavioral nutrition and physical activity research: pooled results of four intensive longitudinal studies and recommendations for future research.

The international journal of behavioral nutrition and physical activity·2024
Same author

Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination.

Ultramicroscopy·2024
Same author

Sick leave due to SARS-CoV-2 infection.

Occupational medicine (Oxford, England)·2023
Same author

Atom counting from a combination of two ADF STEM images.

Ultramicroscopy·2023
Same journal

Efficient methods for wave propagation in electron microscopy.

Ultramicroscopy·2026
Same journal

Unsupervised deep image prior for sparse-view and limited-angle electron tomography.

Ultramicroscopy·2026
Same journal

Determination of the structure of the tertiary phase in the alloy Al<sub>10</sub>Mo<sub>10</sub>Nb<sub>10</sub>Ta<sub>10</sub>Ti<sub>30</sub>Zr<sub>30</sub> using convergent beam electron diffraction.

Ultramicroscopy·2026
Same journal

Predictive drift compensation of multi-frame STEM via live scan modification.

Ultramicroscopy·2026
Same journal

Deep PACBED: Multitask analysis of PACBED images using deep neural networks.

Ultramicroscopy·2026
Same journal

Guided progressive reconstructive imaging: A new quantization-based framework for low-dose, high-throughput and real-time analytical ptychography.

Ultramicroscopy·2026
See all related articles

Related Experiment Video

Updated: Jun 22, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.

S Van Aert1, J Verbeeck, R Erni

  • 1Electron Microscopy for Materials Science (EMAT), University of Antwerp, Antwerp, Belgium. sandra.vanaert@ua.ac.be

Ultramicroscopy
|June 16, 2009
PubMed
Summary
This summary is machine-generated.

A new model-based method quantifies atomic column composition using high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) images. This technique enables accurate chemical analysis without electron energy-loss spectra.

More Related Videos

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Related Experiment Videos

Last Updated: Jun 22, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Physics

Background:

  • High-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) is crucial for atomic resolution imaging.
  • Quantifying chemical composition at the atomic scale remains a challenge.
  • Electron energy-loss spectroscopy (EELS) is often required for compositional analysis.

Purpose of the Study:

  • To develop a model-based method for relative quantification of atomic column chemical composition.
  • To enable compositional analysis using only HAADF-STEM images.
  • To improve accuracy and precision in identifying atomic column types.

Main Methods:

  • A statistical parameter estimation theory is applied to quantify scattered electron intensity.
  • A simple, effective incoherent model incorporating probe intensity profile is used.
  • Model fitting to experimental HAADF-STEM images estimates scattered intensities.
  • Statistical hypothesis testing distinguishes and identifies atomic column types.

Main Results:

  • The method accurately quantifies chemical composition of atomic columns.
  • Distinguishing atomic columns with an average atomic number difference as small as 3 is achieved.
  • Reliability is validated using simulated and experimental HAADF-STEM images combined with EELS data.

Conclusions:

  • A novel, model-based approach allows relative chemical quantification of atomic columns solely from HAADF-STEM images.
  • This eliminates the need for simultaneous electron energy-loss spectra acquisition.
  • Enables quantitative atomic-resolution mapping with high accuracy and precision.