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Ultramicroscopy|December 9, 2008
Statistical analysis of atom probe data: detecting the early stages of solute clustering and/or co-segregationJ M Hyde, A Cerezo, T J WilliamsUltramicroscopy|January 10, 2009
A quantitative assessment of microelectrodesRalf Schlesiger, Guido SchmitzUltramicroscopy|January 13, 2009
Spin polarization of field-emitted electrons from half-metallic Co2MnSi thin films grown on a W(001) facetShigekazu Nagai, Yuji Fujiwara, Koichi HataUltramicroscopy|November 21, 2008
The influence of elastic strain on the early stages of decomposition in Cu-1.7at% FeThomas Rademacher, Talaat Al-Kassab, Reiner KirchheimUltramicroscopy|January 20, 2009
Fabrication of high-aspect ratio Si pillars for atom probe 'lift-out' and field ionization tipsR A Morris, R L Martens, I Zana, et al.Ultramicroscopy|January 21, 2009
The influence of Cu addition on precipitation in Fe-Cr-Ni-Al-(Cu) model alloysS Höring, N Wanderka, J BanhartUltramicroscopy|November 30, 2010
A force-matching method for quantitative hardness measurements by atomic force microscopy with diamond-tipped sapphire cantileversFrederic Sansoz, Travis GangUltramicroscopy|November 2, 2010
Crystal structure solution via precession electron diffraction data: the BEA algorithmGiovanni Luca Cascarano, Carmelo Giacovazzo, Benedetta CarrozziniUltramicroscopy|November 6, 2010
A systematic procedure for determining the chiral indices of multi-walled carbon nanotubes using electron diffraction--each and every shellHakan Deniz, Anna Derbakova, Lu-Chang QinUltramicroscopy|March 16, 2013
Coupling atom probe tomography and photoluminescence spectroscopy: exploratory results and perspectivesLorenzo Rigutti, Angela Vella, François Vurpillot, et al.Pageof 460